🔧 Industrial Instrumentation Weekly Digest
Week of: September 7, 2026 – September 14, 2026
Your weekly update on pressure measurement, industrial IoT, and process automation news.
📅 September 11, 2026
- Heterogeneous Memory Chiplets Accelerate Multi-Request LLM Inference (NUS)
📝 Researchers at the National University of Singapore published a technical paper titled “CHIPSMORE: Compute-in-Interconnect and -Memory Chiplets for Multi-Mode Multi-Request LLM Inference Acceleration.
📰 Source: SemiEngineering - Reducing HBM ECC Controller Overhead For AI Inference (RPI, IBM)
📝 Researchers at Rensselaer Polytechnic Institute and IBM T.J. Watson Research Center published a technical paper titled “REACH: Controller-Managed Long-Span ECC for HBM AI Inference.” Abstract Excerpt:
📰 Source: SemiEngineering - Molybdenum Quasi Phase-Only Masks Improve EUV Imaging (NYCU, TSMC)
📝 Researchers at National Yang Ming Chiao Tung University and TSMC published a technical paper titled “High contrast EUV imaging enabled by topological quasi phase-only masks.” Abstract Excerpt: “Here,
📰 Source: SemiEngineering - Characterizing Charge Components In TMD-based MOS Structures (imec, KU Leuven, ASM)
📝 Researchers at imec, KU Leuven, and ASM published a technical paper titled “Dissecting the transition metal dichalcogenides-based metal-oxide-semiconductor structures charge components.” Abstract Exce
📰 Source: SemiEngineering - Modeling Predicts Cure And Thermal Endurance Of Advanced Packaging Underfill (NIST, UCSD et al.)
📝 Researchers at the NIST, UCSD et al. published a technical paper titled “Predicting Cure Evolution and Thermal Endurance of a Highly Filled Epoxy Underfill for Advanced Packaging.” Abstract Excerpt: “
📰 Source: SemiEngineering - HW Information-Flow Tracking for Pre-Silicon Security Testing (Princeton, MIT, EPFL)
📝 Researchers at Princeton University, MIT CSAIL, and EPFL published a technical paper titled “Efficient Hardware Information-Flow Tracking for Pre-Silicon Security Testing.” Abstract “Register-Transfer
📰 Source: SemiEngineering - How does thermal imaging improve transport safety and incident prevention?
📝 In the intelligent transport systems (ITS) sector, the ultimate measure of success is not a headline-making emergency response – it is preventing an initial anomaly from escalating into a disaster. Fr
📰 Source: Instrumentation - ifm launches PF15 series flush G1/2 pressure sensor with display for viscous and abrasive media
📝 ifm has introduced the PF15 series, a flush G1/2 pressure sensor with an integrated display, engineered to monitor processes with highly viscous or abrasive media directly on the system. The new PF15x
📰 Source: Instrumentation - What is the strategic advantage of treating calibration as a service?
📝 By Joern Migge, Head of Market Management and Service, Mettler-Toledo Product Inspection Precision in manufacturing is often measured in grams, not guesses. Small inconsistencies in product weight can
📰 Source: Instrumentation - How does real-time ALPHAMETER 2.0 improve biological wastewater treatment?
📝 INVENT has introduced the ALPHAMETER 2.0, the next generation of its measurement and control system for biological wastewater treatment. The system records key process parameters in real time, providi
📰 Source: Instrumentation - Greene Tweed adds cryogenic leak and supercritical CO₂ capabilities to testing portfolio
📝 Greene Tweed, a global leader in advanced materials and high-performance sealing solutions, has broadened its world-class testing infrastructure with cryogenic leak and supercritical CO₂ rapid gas dec
📰 Source: Instrumentation - Chip Industry Week in Review
📝 12-inch high-NA EUV masks; Arm's edge AI push; Amkor's expansion; 3D memory; FeRAM startup makes waves; Qualcomm-AWS $60B custom silicon deal; Ayar Labs' scale-up deal; new iPhone chip and format; rog
📰 Source: SemiEngineering - Teledyne e2v Expands Flash CMOS Image Sensor Family
📝 Teledyne e2v has announced Flash 1K2 and Flash 8K, the latest additions to its Flash CMOS image sensor family. The new sensors join the existing Flash 2K and Flash 4K devices, extending the portfolio
📰 Source: Metrology News - Stratasys Targets Scalable Additive Production With In-Situ Quality Monitoring
📝 Stratasys recently announced it has been awarded $7.8 million of funding through The 2026 America Makes and the Department of War (DoW) Organic Industrial Base (OIB) Modernization Challenge that focus
📰 Source: Metrology News - A digital twin should make a risky claim
📰 Source: Nature - Digital quantum simulations of scattering in quantum field theories using W states
📰 Source: Nature
📅 September 10, 2026
- Teradyne launches advanced UltraFLEXplus instruments
📝 Teradyne, a leading provider of automated test equipment and advanced robotics, announced the launch of three new instruments for its UltraFLEXplus platform, designed to meet the increasingly complex
📰 Source: Instrumentation - Make the most of the PPMA Show 2026 with smart digital tools and features
📝 Presenting the latest technologies from 350+ exhibitors, this year’s PPMA Show promises to be bigger and better than ever. Anticipation is building as the UK’s leading processing and packaging event r
📰 Source: Instrumentation - KIT named finalist for Software Solution of the Year at the 2026 Instrumentation & Electronics Awards
📝 Coplan Ltd is delighted to announce that KIT® has been named a finalist in the Software Solution of the Year category at the 2026 Instrumentation & Electronics Awards. The shortlisting recognises KIT’
📰 Source: Instrumentation - Proximity probe sensor provides optimum performance and outstanding flexibility
📝 Proximity probe sensors are playing an increasingly significant role in today’s machine monitoring applications, especially in harsh environments where systems demand, effective and reliable measuring
📰 Source: Instrumentation - Powell Electronics shows latest highly reliable connector solutions
for rail applications at Innotrans 2026
📝 At Innotrans 2026 in Berlin, Germany from 22nd to 25th Sept 2026, Powell Electronics will be showing the latest hi-reliability connector solutions for harsh environment rail applications from its key
📰 Source: Instrumentation - Redefining Processes At Sub-2nm
📝 Discrete steps are being merged with others as dimensions shrink into the angstrom range.
The post Redefining Processes At Sub-2nm appeared first on Semiconductor Engineering.
📰 Source: SemiEngineering - Silent Data Errors Redefine Test Coverage And Fleet Maintenance Strategies
📝 Through better manufacturing screening, DFT for systems and fleet monitors, this major scourge on data center hardware is gradually being tamed.
The post Silent Data Errors Redefine Test Coverage And
📰 Source: SemiEngineering - Validation Gets Tested At 1kW
📝 Kilowatt-class AI accelerators are forcing engineers to rethink what counts as adequate coverage across workload, thermal behavior, test hardware, and time.
The post Validation Gets Tested At 1kW appe
📰 Source: SemiEngineering - Beyond Quality Control – Using Inspection to Optimise Production
📝 Today, efficiency is no longer achieved at the end of production, but within the process itself. Companies that do not make consistent use of their data often miss out on potential that is not even vi
📰 Source: Metrology News - Anthropic Develops Standard for AI Agents to Control Manufacturing Equipment
📝 Anthropic has introduced a research preview of the Model Hardware Standard (MHS), a specification designed to allow AI agents to communicate with and control physical equipment including robotic arms,
📰 Source: Metrology News - Electric fields take control of ferrons
📰 Source: Nature - Trion Hall effect in electron–hole double layers
📰 Source: Nature
📅 September 9, 2026
- How Augmented Reality is Transforming Metrology in Smart Factories
📝 As manufacturing industries transition toward Smart Factory architectures, quality control is shifting from a post-production filter to an inline, real-time feedback loop. At the heart of this transfo
📰 Source: Metrology News - Rockwell Expands AI-Driven Quality Inspection with Plex QMS
📝 Rockwell Automation has announced an API-enabled integration between Plex Quality Management System (QMS) and FactoryTalk Analytics VisionAI. The integration expands AI-driven quality management and r
📰 Source: Metrology News
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🔗 Fandesensor – Industrial Pressure & Level Measurement Solutions
🕒 Published on: 9/14/2026, 12:30:24 AM
