🔧 Industrial Instrumentation Weekly Digest
Week of: October 5, 2026 – October 12, 2026
Your weekly update on pressure measurement, industrial IoT, and process automation news.
📅 October 9, 2026
- Endress+Hauser inaugurates its campus in Cernay
📝 Endress+Hauser inaugurated its new company campus in Cernay, in the Alsace region of France, on 2 October 2026. The event was attended by customers, partners, company employees, and business and gover
📰 Source: Instrumentation - New FLIR RS8480 brings HD MWIR detail to proven long-range science camera platform
📝 Teledyne FLIR has launched the RS8480, the first smaller form-factor, high-definition midwave infrared (HD MWIR) science camera in the RS line-up. Combining a new 1280 × 1024 HD MWIR sensor with the p
📰 Source: Instrumentation - Renishaw launches its new XC100 environmental compensator for precision calibration
📝 Renishaw is proud to announce the launch of its new XC100 environmental compensator. Building on Renishaw’s proven XC-80 technology, the XC100 delivers real-time automatic wavelength correction and ac
📰 Source: Instrumentation - Flir adds four new Meterlink-connected tools for field professionals
📝 Teledyne FLIR has announced four new additions to its Meterlink test and measurement portfolio: the Flir EV86-NACS and EV86-T2 EV charger analysers, Flir DM266 compact thermal imaging multimeter and F
📰 Source: Instrumentation - Chip Industry Week In Review
📝 $2B foundry pact; hyper-NA EUV; TSMC, Samsung financials; Canon readies nanoimprint; AI chips under scrutiny; $10T data center buildout; $1.5B SiC boost; chip smuggling; 800V power gains traction; qua
📰 Source: SemiEngineering - OMNIVISION Expands Global Shutter Imaging for Industrial Vision and Robotics
📝 OMNIVISION has introduced two new global shutter CMOS image sensors aimed at the next generation of industrial machine vision, factory automation, intelligent transportation and robotics applications.
📰 Source: Metrology News - Waygate and Varex Imaging to Accelerate Transformation of Field Radiography to Digital
📝 Waygate Technologies, a leader in nondestructive testing (NDT) solutions for industrial and energy infrastructure inspection, and Varex Imaging, a leader in X-ray imaging components and detector tech
📰 Source: Metrology News - Orthorhombic ice
📰 Source: Nature - Lift from the flow
📰 Source: Nature - Active wetting of an implanting embryo
📰 Source: Nature - You should advertise your conference
📰 Source: Nature - Capture CO<sub>2</sub> concentration
📰 Source: Nature - The old powers on
📰 Source: Nature - Order from chaos with adaptive circuits on quantum hardware
📰 Source: Nature
📅 October 8, 2026
- Application optimised ruggedised lenses
📝 Resolve Optics is a leading supplier of custom ruggedised lenses built to withstand extreme environments, severe shocks, and constant vibrations. In recent years – Resolve Optics has designed and supp
📰 Source: Instrumentation - New Druck sensor helps space companies improve safety and accelerate testing programmes
📝 Druck, a Crane Company business and a leader in pressure measurement, has launched the UNIK5000F, a new oxygen-compatible pressure sensor designed to meet the demanding requirements of the rapidly exp
📰 Source: Instrumentation - Mouser now shipping TE Connectivity’s EEPROM embedded smart connector
📝 Mouser Electronics is now stocking the new EEPROM-embedded smart connector from TE Connectivity. The EEPROM-embedded smart connector simplifies platform development and production processes by combini
📰 Source: Instrumentation - Kistler presents Real-Time Release Testing at Fakuma 2026
📝 At this year’s Fakuma, Kistler sends a clear signal for the next evolutionary stage in quality assurance for medical technology: moving from sample-based release toward complete, auditable quality evi
📰 Source: Instrumentation - From imaging to insight: electron microscopy workshop for industry
📝 Thermo Fisher Scientific, in collaboration with the University of Birmingham, will host a free, one-day electron microscopy and microanalysis workshop at the University’s Edgbaston campus on 14th Octo
📰 Source: Instrumentation - Finding Critical Defects Before They Become Costly Failures: Process Control For Hybrid Bonding And Advanced Packaging
📝 How complementary inspection and metrology techniques can detect smaller defects and distinguish among a wide range of defect types within a unified workflow.
The post Finding Critical Defects Before
📰 Source: SemiEngineering - Demonstrating Plasma As A Viable Alternative To KOH For LCP Metallization Applications
📝 How optimized plasma processing can achieve effective surface roughening and activation.
The post Demonstrating Plasma As A Viable Alternative To KOH For LCP Metallization Applications appeared first
📰 Source: SemiEngineering - Closing The Visibility Gap
📝 More measurements don’t eliminate blind spots when each view captures only part of the device.
The post Closing The Visibility Gap appeared first on Semiconductor Engineering.
📰 Source: SemiEngineering - From Silicon To Systems: Redefining Competitive Advantage, Part 3
📝 The next generation of industry leaders may look very different from the last.
The post From Silicon To Systems: Redefining Competitive Advantage, Part 3 appeared first on Semiconductor Engineering.
📰 Source: SemiEngineering - Shift Left Complicates Fab Data Management
📝 Streaming sensor data creates new challenges for advanced process control.
The post Shift Left Complicates Fab Data Management appeared first on Semiconductor Engineering.
📰 Source: SemiEngineering - From Process Learning To Production Control: Trends In Advanced Packaging And Implications To Characterization And Test
📝 An integrated methodology for accelerating process development and sustaining production control for advanced packaging technologies.
The post From Process Learning To Production Control: Trends In Ad
📰 Source: SemiEngineering - The FAaST Track: Enabling Advanced Packaging Through Electrical Process Control
📝 The next frontier in process control isn’t just visual—it’s electrical.
The post The FAaST Track: Enabling Advanced Packaging Through Electrical Process Control appeared first on Semiconductor Enginee
📰 Source: SemiEngineering - CPO Testing Faces A Moving Target Problem
📝 Test vendors are adapting to changing connector architectures and extreme alignment tolerances as co-packaged optics heads toward mainstream.
The post CPO Testing Faces A Moving Target Problem appeare
📰 Source: SemiEngineering - Perspectives On Test: System Level Test For AI & Data Centers
📝 Testing every device under real-world conditions has never been more important.
The post Perspectives On Test: System Level Test For AI & Data Centers appeared first on Semiconductor Engineering.
📰 Source: SemiEngineering - AI4RVI Brings Onboard AI to High-Definition Tube Inspection
📝 AI4RVI has announce the launch of Edgevision, a next-generation remote visual inspection (RVI) system built to deliver true high-definition imaging of tube interior conditions including boilers, heat
📰 Source: Metrology News - Freeze CAD Revision Before Reusing an Inspection Plan
📝 An inspection plan inherited from revision A needs a clear starting point when revision B arrives. Fix the exact model pair, establish the controlling requirements, and document the responsible engine
📰 Source: Metrology News
Stay updated with the latest in industrial instrumentation.
🔗 Fandesensor – Industrial Pressure & Level Measurement Solutions
🕒 Published on: 10/12/2026, 12:36:03 AM
