🔧 Industrial Instrumentation Weekly Digest
Week of: June 22, 2026 – June 29, 2026
Your weekly update on pressure measurement, industrial IoT, and process automation news.
📅 June 26, 2026
- Renesas acquires Pictorus to simplify and accelerate embedded application software development
📝 Renesas Electronics, a premier supplier of advanced semiconductor solutions, announced today that a Renesas subsidiary has completed the acquisition of software developer Pictorus, based in Oakland, C
📰 Source: Instrumentation - Is your innovation pushing the industry forward?
📝 Entries are now open for the Excellence in Innovation Award category at the 2026 Instrumentation & Electronics Awards, with companies across the instrumentation and electronics sectors being encourage
📰 Source: Instrumentation - Beckhoff UK unveils new customer-focused head office in Henley-on-Thames
📝 Industrial control and automation specialist, Beckhoff UK has announced the opening of its new head office in Henley, marking an important step in the company’s ongoing growth and its commitment to su
📰 Source: Instrumentation - Why connectors matter for cybersecurity and resilience in industrial systems
📝 Cyberattacks on industrial networks often attract the spotlight, yet regulators have also cautioned against vulnerabilities at the hardware layer. Standards like IEC 62443 and the NIST cybersecurity f
📰 Source: Instrumentation - Long-distance signal delivery is critical to rail safety
📝 Copper cabling has long been used in safety-critical rail applications such as emergency tripping systems. However, modern fibre optic technologies can offer significant advantages when protecting rem
📰 Source: Instrumentation - Chip Industry Week In Review
📝 Onsemi to buy Synaptics; IBM’s 7Å chip w/40% more SRAM area; 1nm MoS2 nanotubes; AI pressure points; memory updates; $250M CHIPS Act award; trade secret theft; new advanced packaging site; MEMS capaci
📰 Source: SemiEngineering - Portable Optical Inspection System Built for High-Volume CNC Production
📝 OASIS Inspection Systems, an innovator in precision measurement and optical inspection technology, has announced the commercial launch of the EDGE CORE, model a next-generation optical inspection syst
📰 Source: Metrology News - TopMap Sherpa Launch Simplifies Surface Measurement and Analysis
📝 Polytec has introduced TopMap Sherpa, a next-generation software platform developed for its TopMap optical surface metrology systems. Designed to simplify measurement workflows while enhancing product
📰 Source: Metrology News - Ultrashort light pulses can transform a semiconductor into a topological insulator
📰 Source: Nature - A minimal in vitro assay for cell intercalation highlights the importance of interfacial tension and migratory forces
📰 Source: Nature - Coherent control of interacting solid-state spins below the diffraction limit
📰 Source: Nature
📅 June 25, 2026
- Greene Tweed accelerates customer innovation with rapid prototyping capability for thermoplastic composites
📝 Greene Tweed, a global leader in advanced materials and high-performance solutions, has developed a rapid prototyping process for its Xycomp® DLF™ material that helps aerospace customers accelerate me
📰 Source: Instrumentation - Could your distributor business be the industry’s best?
📝 Entries are now open for the Distributor of the Year category at the 2026 Instrumentation & Electronics Awards, with companies across the sector being encouraged to showcase the service, technical exp
📰 Source: Instrumentation - Could a Virtual Twin make manufacturing change a non-event?
📝 By Adrian Wood, Director of Strategic Business Development for DELMIA Energy performance does not come from individual initiatives. It comes from operations that were designed with energy in mind at e
📰 Source: Instrumentation - Non-invasive real-time liquid flow meters
📝 Biotech Fluidics offers a range of non-invasive flow meters for real-time, non-invasive monitoring of liquid flow. Measuring liquid flow rate has traditionally been served by devices such as volumetri
📰 Source: Instrumentation - NE-95-certified signal conditioners and measuring transducers for demanding process industry applications
📝 Phoenix Contact is now providing complete, up-to-date NE-95 test reports for selected devices from the Mini Analog Pro and Macx Analog families of signal conditioners. The tests were carried out in ac
📰 Source: Instrumentation - I/O Design Challenges Grow In AI Data Centers And HPC Clusters
📝 Physical I/Os can be a chokepoint for high-performance chips and high-speed interconnect protocols, requiring design tradeoffs and extra reliability measures.
The post I/O Design Challenges Grow In A
📰 Source: SemiEngineering - Verification Methodologies Struggle To Keep Up With AI
📝 Engineers are flooded with new capabilities. The problem now is how best to deploy them.
The post Verification Methodologies Struggle To Keep Up With AI appeared first on Semiconductor Engineering.
📰 Source: SemiEngineering - Executive Outlook: Agentic AI’s Impact On Chip Design
📝 Can engineers trust AI to get everything right in semiconductor design and verification?
The post Executive Outlook: Agentic AI’s Impact On Chip Design appeared first on Semiconductor Engineering.
📰 Source: SemiEngineering - How Far Left Can We Really Shift Verification?
📝 When verification is never fully complete, the only question left is how early it can begin.
The post How Far Left Can We Really Shift Verification? appeared first on Semiconductor Engineering.
📰 Source: SemiEngineering - Realizing The Future Of 3D-IC Design
📝 Designing heterogeneously integrated packages necessitates a system-centric co-design approach.
The post Realizing The Future Of 3D-IC Design appeared first on Semiconductor Engineering.
📰 Source: SemiEngineering - Reducing Avoidable Memory Trips In HBM Systems
📝 Last-level cache helps manage data movement and reduces pressure on the external memory subsystem.
The post Reducing Avoidable Memory Trips In HBM Systems appeared first on Semiconductor Engineering.
📰 Source: SemiEngineering - Wafer-Scale vs. Chiplets: The New War? Part 2
📝 Moving data fast enough so that compute stops waiting.
The post Wafer-Scale vs. Chiplets: The New War? Part 2 appeared first on Semiconductor Engineering.
📰 Source: SemiEngineering - More Massive Still: Why AI Infrastructure Demands A Unified Design Approach
📝 Tokens-per-watt is now the primary metric driving AI data center optimization.
The post More Massive Still: Why AI Infrastructure Demands A Unified Design Approach appeared first on Semiconductor Engi
📰 Source: SemiEngineering - Introducing An Agentic LLM For Chip Design
📝 A fine-tuned model brings frontier-level AI performance to chip design.
The post Introducing An Agentic LLM For Chip Design appeared first on Semiconductor Engineering.
📰 Source: SemiEngineering - Portable 3D Metrology Delivers Fast and Accurate Inspection of Multi-Stage Compressors
📝 Because of the intricate geometry and large dimensions, traditional measuring tools were simply not suitable. Simple instruments, such as calipers, could not capture the complex shapes involved.
The p
📰 Source: Metrology News - Pentaxia Halves Production Time and Eliminates Rework with MSP PerfectPart
📝 Advanced tooling and composite components manufacturer Pentaxia has transformed how it approaches the machining of complex components after introducing MSP’s PerfectPart suite of CNC metrology product
📰 Source: Metrology News - Order Uptick Offers Cautious Relief for German Machine Tool Sector Amid Ongoing Downturn
📝 Following three difficult years, the German machine tool industry can breathe a first sigh of relief: incoming orders increased by 15 percent in the first quarter of 2026. Nevertheless, the situation
📰 Source: Metrology News - Hidden loop currents in a kagome metal
📰 Source: Nature - Angular momentum of rotating fermionic superfluids by Sagnac phonon interferometry
📰 Source: Nature
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🔗 Fandesensor – Industrial Pressure & Level Measurement Solutions
🕒 Published on: 6/29/2026, 12:31:03 AM
